The NBS-OWLSanalysis software evaluates NTE and NTM effective RI data related to two guided mode polarizations, measured by OWLS. The analysis enables one to determine the mass, thickness as well as RI of layers formed on the of the optical chip surface. The computation of nA and dA is carried out by solving the homogeneous and isotropic 4-layer mode equations provided that the required parameters were also given/calculated (nF, dF, nS, nC). 


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